ICSA Colloquium - 01/06/2023

Title: A Systematic Study of DRAM Faults in the Field

Abstract: Memory reliability is a continuing concern in computer systems. In this talk, we will discuss faults found in memory systems over the past ten years, with a specific focus on faults found in DDR4 memory systems, with a focus on how the data was used to guide HBM3 and DDR5 memory system design.

Bio: Vilas Sridharan is currently an AMD Senior Fellow where he leads the RAS (Reliability, Availability, and Serviceability) Architecture team. His research focuses on the modeling of hardware faults and architectural and micro-architectural approaches to reliability and fault tolerance in high-performance microprocessors. Vilas received his Ph.D. and M.S.E. from the Department of Electrical and Computer Engineering at Northeastern University, and his B.S.E. in Computer Engineering from Princeton University in 2000. From 2000 - 2004, he worked in the SPARC server division at Sun Microsystems. Since 2010, he has been on AMD’s RAS Architecture team.